A robust finite-point based gate model considering process variations

Alex Mitev, Dinesh Ganesan, Dheepan Shanmugasundaram, Yu Cao, Janet M. Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

This paper proposes a robust gate model based on a finite-point modeling scheme. With current source model (CSM) framework, a robust, finite-point gate model is constructed. The new model depends on the selective points of I-V curves of gates. Thus, it implicitly incorporates the variation related parameters into finite points. In addition, to provide good accuracy on output waveform, the new model creates the input and output capacitance elements as nonlinear dependency on input/output waveform and process variation parameters. Experimental results show that the generated gate model has less than 3.7% error at mean, less than 6.2% error at variance and less than 5.8% at 90% percentile for cumulative density functions (CDFs).

Original languageEnglish (US)
Title of host publicationIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
Pages692-697
Number of pages6
DOIs
StatePublished - 2007
Event2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD - San Jose, CA, United States
Duration: Nov 4 2007Nov 8 2007

Other

Other2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
CountryUnited States
CitySan Jose, CA
Period11/4/0711/8/07

Fingerprint

Probability density function
Capacitance

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Mitev, A., Ganesan, D., Shanmugasundaram, D., Cao, Y., & Wang, J. M. (2007). A robust finite-point based gate model considering process variations. In IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD (pp. 692-697). [4397346] https://doi.org/10.1109/ICCAD.2007.4397346

A robust finite-point based gate model considering process variations. / Mitev, Alex; Ganesan, Dinesh; Shanmugasundaram, Dheepan; Cao, Yu; Wang, Janet M.

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD. 2007. p. 692-697 4397346.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Mitev, A, Ganesan, D, Shanmugasundaram, D, Cao, Y & Wang, JM 2007, A robust finite-point based gate model considering process variations. in IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD., 4397346, pp. 692-697, 2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD, San Jose, CA, United States, 11/4/07. https://doi.org/10.1109/ICCAD.2007.4397346
Mitev A, Ganesan D, Shanmugasundaram D, Cao Y, Wang JM. A robust finite-point based gate model considering process variations. In IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD. 2007. p. 692-697. 4397346 https://doi.org/10.1109/ICCAD.2007.4397346
Mitev, Alex ; Ganesan, Dinesh ; Shanmugasundaram, Dheepan ; Cao, Yu ; Wang, Janet M. / A robust finite-point based gate model considering process variations. IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD. 2007. pp. 692-697
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