A review of yield modelling techniques for semiconductor manufacturing

N. Kumar, K. Kennedy, K. Gildersleeve, R. Abelson, C. M. Mastrangelo, Douglas Montgomery

Research output: Contribution to journalArticle

57 Citations (Scopus)

Abstract

Semiconductor manufacturing is a complex multistage manufacturing process, and wafer fabs use complex processes involving billions of dollars worth of equipment to produce integrated circuits. The level of complexities associated with an integrated circuit is increasing in terms of feature size and number of devices. Companies use several performance metrics such as defectiveness, yield, and cycle time to improve manufacturing performance. Maintaining high yield through reliable and accurate quality control measures is one of the key performance criteria used by companies. The intent of this paper is to provide a review of the literature dealing with critical aspects of yield modelling. A review of many topics from simple probabilistic yield models to the incorporation of critical features such as spatial defects and radial yield losses will be provided. We will also assess empirical techniques used to model variations associated with complex interrelated wafer manufacturing processes. We emphasize that yield modelling should not be considered in isolation and system-wide aspects are necessary for integrated yield modelling and analysis.

Original languageEnglish (US)
Pages (from-to)5019-5036
Number of pages18
JournalInternational Journal of Production Research
Volume44
Issue number23
DOIs
StatePublished - Dec 1 2006

Fingerprint

Semiconductor materials
Integrated circuits
Quality control
Industry
Defects
Semiconductor manufacturing
Modeling
Manufacturing process

Keywords

  • Semiconductor manufacturing
  • Yield modelling

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Management Science and Operations Research

Cite this

A review of yield modelling techniques for semiconductor manufacturing. / Kumar, N.; Kennedy, K.; Gildersleeve, K.; Abelson, R.; Mastrangelo, C. M.; Montgomery, Douglas.

In: International Journal of Production Research, Vol. 44, No. 23, 01.12.2006, p. 5019-5036.

Research output: Contribution to journalArticle

Kumar, N. ; Kennedy, K. ; Gildersleeve, K. ; Abelson, R. ; Mastrangelo, C. M. ; Montgomery, Douglas. / A review of yield modelling techniques for semiconductor manufacturing. In: International Journal of Production Research. 2006 ; Vol. 44, No. 23. pp. 5019-5036.
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