A resilience roadmap

Sani R. Nassif, Nikil Mehta, Yu Cao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

65 Citations (Scopus)

Abstract

Technology scaling has an increasing impact on the resilience of CMOS circuits. This outcome is the result of (a) increasing sensitivity to various intrinsic and extrinsic noise sources as circuits shrink, and (b) a corresponding increase in parametric variability causing behavior similar to what would be expected with hard (topological) faults. This paper examines the issue of circuit resilience, then proposes and demonstrates a roadmap for evaluating fault rates starting at the 45nm and going down to the 12nm nodes. The complete infrastructure necessary to make these predictions is placed in the open source domain, with the hope that it will invigorate research in this area.

Original languageEnglish (US)
Title of host publicationProceedings -Design, Automation and Test in Europe, DATE
Pages1011-1016
Number of pages6
StatePublished - 2010
EventDesign, Automation and Test in Europe Conference and Exhibition, DATE 2010 - Dresden, Germany
Duration: Mar 8 2010Mar 12 2010

Other

OtherDesign, Automation and Test in Europe Conference and Exhibition, DATE 2010
CountryGermany
CityDresden
Period3/8/103/12/10

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Networks (circuits)

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Nassif, S. R., Mehta, N., & Cao, Y. (2010). A resilience roadmap. In Proceedings -Design, Automation and Test in Europe, DATE (pp. 1011-1016). [5456958]

A resilience roadmap. / Nassif, Sani R.; Mehta, Nikil; Cao, Yu.

Proceedings -Design, Automation and Test in Europe, DATE. 2010. p. 1011-1016 5456958.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nassif, SR, Mehta, N & Cao, Y 2010, A resilience roadmap. in Proceedings -Design, Automation and Test in Europe, DATE., 5456958, pp. 1011-1016, Design, Automation and Test in Europe Conference and Exhibition, DATE 2010, Dresden, Germany, 3/8/10.
Nassif SR, Mehta N, Cao Y. A resilience roadmap. In Proceedings -Design, Automation and Test in Europe, DATE. 2010. p. 1011-1016. 5456958
Nassif, Sani R. ; Mehta, Nikil ; Cao, Yu. / A resilience roadmap. Proceedings -Design, Automation and Test in Europe, DATE. 2010. pp. 1011-1016
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