A quasi-optical testbed for terahertz on-wafer device and circuit characterization

Yiran Cui; Georgios C. Trichopoulos

doi:10.1109/APUSNCURSINRSM.2019.8888457

A quasi-optical testbed for terahertz on-wafer device and circuit characterization

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We present a novel quasi-optical vector network analyzer (VNA) topology for terahertz (THz) on-wafer measurement and characterization. We combine a frequency-independent quasi-optical topology and on-wafer antenna probes to enable a non-contact, ultra-wideband THz on-wafer testing system. Additionally, the use of optical components allows the use of photonics-based THz emitters and detectors, which also support ultra-wide bandwidths of operation. A proof-of-concept testing setup is built and evaluated in the 300-340 GHz band using on-wafer measurements. The characterization of a passive device shows good agreement with simulation results and verifies the feasibility of the proposed VNA topology.

Original language	English (US)
Title of host publication	2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1729-1730
Number of pages	2
ISBN (Electronic)	9781728106922
DOIs	https://doi.org/10.1109/APUSNCURSINRSM.2019.8888457
State	Published - Jul 2019
Event	2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Atlanta, United States Duration: Jul 7 2019 → Jul 12 2019

Publication series

Name	2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings

Conference

Conference	2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019
Country/Territory	United States
City	Atlanta
Period	7/7/19 → 7/12/19

Keywords

Quasi-optics
Terahertz metrology
Vector network analyzer

ASJC Scopus subject areas

Computer Networks and Communications
Signal Processing
Instrumentation

Access to Document

10.1109/APUSNCURSINRSM.2019.8888457

Cite this

Cui, Y., & Trichopoulos, G. C. (2019). A quasi-optical testbed for terahertz on-wafer device and circuit characterization. In 2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings (pp. 1729-1730). Article 8888457 (2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APUSNCURSINRSM.2019.8888457

A quasi-optical testbed for terahertz on-wafer device and circuit characterization. / Cui, Yiran; Trichopoulos, Georgios C.
2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. p. 1729-1730 8888457 (2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Cui, Y & Trichopoulos, GC 2019, A quasi-optical testbed for terahertz on-wafer device and circuit characterization. in 2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings., 8888457, 2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 1729-1730, 2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019, Atlanta, United States, 7/7/19. https://doi.org/10.1109/APUSNCURSINRSM.2019.8888457

Cui Y, Trichopoulos GC. A quasi-optical testbed for terahertz on-wafer device and circuit characterization. In 2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2019. p. 1729-1730. 8888457. (2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings). doi: 10.1109/APUSNCURSINRSM.2019.8888457

Cui, Yiran ; Trichopoulos, Georgios C. / A quasi-optical testbed for terahertz on-wafer device and circuit characterization. 2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. pp. 1729-1730 (2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, APSURSI 2019 - Proceedings).

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abstract = "We present a novel quasi-optical vector network analyzer (VNA) topology for terahertz (THz) on-wafer measurement and characterization. We combine a frequency-independent quasi-optical topology and on-wafer antenna probes to enable a non-contact, ultra-wideband THz on-wafer testing system. Additionally, the use of optical components allows the use of photonics-based THz emitters and detectors, which also support ultra-wide bandwidths of operation. A proof-of-concept testing setup is built and evaluated in the 300-340 GHz band using on-wafer measurements. The characterization of a passive device shows good agreement with simulation results and verifies the feasibility of the proposed VNA topology.",

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A quasi-optical testbed for terahertz on-wafer device and circuit characterization

Abstract

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Conference

Keywords

ASJC Scopus subject areas

Access to Document

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