A percolative approach to investigate electromigration failure in printed Ag structures

Zhao Zhao; Avinash Mamidanna; Christopher Lefky; Owen Hildreth; Terry Alford

doi:10.1063/1.4963755

A percolative approach to investigate electromigration failure in printed Ag structures

Zhao Zhao, Avinash Mamidanna, Christopher Lefky, Owen Hildreth, Terry Alford

Research output: Contribution to journal › Article › peer-review

24 Scopus citations

Abstract

The ease of fabrication and wide application of printed microelectronics are driving advances in reactive inks. The long-term performance of structures printed using reactive ink is important for their application in microelectronics. In this study, silver lines are printed with low-temperature, self-reducing, silver-diamine based ink. The electromigration failure of the printed silver is first studied using Black's equation. However, due to the porous nature of the printed Ag line, Black's equation is not the best fit for predicting the lifetime, this is because Black's equation does not take into account morphology-induced current crowding. We find that the resistivity of the printed Ag lines can be described (as a function of void fraction) by percolation theory. In addition, we also demonstrate that the failure lifetimes of the printed Ag can be predicted quite well by a percolative model of failure.

Original language	English (US)
Article number	125104
Journal	Journal of Applied Physics
Volume	120
Issue number	12
DOIs	https://doi.org/10.1063/1.4963755
State	Published - Sep 28 2016

ASJC Scopus subject areas

General Physics and Astronomy

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10.1063/1.4963755

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abstract = "The ease of fabrication and wide application of printed microelectronics are driving advances in reactive inks. The long-term performance of structures printed using reactive ink is important for their application in microelectronics. In this study, silver lines are printed with low-temperature, self-reducing, silver-diamine based ink. The electromigration failure of the printed silver is first studied using Black's equation. However, due to the porous nature of the printed Ag line, Black's equation is not the best fit for predicting the lifetime, this is because Black's equation does not take into account morphology-induced current crowding. We find that the resistivity of the printed Ag lines can be described (as a function of void fraction) by percolation theory. In addition, we also demonstrate that the failure lifetimes of the printed Ag can be predicted quite well by a percolative model of failure.",

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AU - Lefky, Christopher

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A percolative approach to investigate electromigration failure in printed Ag structures

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