A percolation model of conduction in segregated systems of metallic and insulating materials: Application to thick film resistors

P. J.S. Ewen, J. M. Robertson

Research output: Contribution to journalArticle

47 Scopus citations

Abstract

An expression relating the resistivity, R, of a segregated system of conducting and non-conducting media to the volume fraction, V, of the conducting component has been derived by applying percolation theory to a simple but realistic model of the system microstructure. It is proposed that R varies as (p'-pc)-mu where pc is the percolation threshold, mu is the conductivity critical exponent for 3D systems and p' is the fraction of sites in the conducting region that are filled by conducting particles; p' is related to V. The expression can be used to fit the observed R-V curves (blending curves) of thick film resistor systems, which are known to have a segregated structure. The model is valid over a useful range of volume fractions and employs typical values for pc and mu .

Original languageEnglish (US)
Article number015
Pages (from-to)2253-2268
Number of pages16
JournalJournal of Physics D: Applied Physics
Volume14
Issue number12
DOIs
StatePublished - Dec 1 1981

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Acoustics and Ultrasonics
  • Surfaces, Coatings and Films

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