TY - GEN
T1 - A novel technique for performing PID susceptibility screening during the solar cell fabrication process
AU - Oh, Jaewon
AU - Dahal, Som
AU - Dauksher, Bill
AU - Bowden, Stuart
AU - Tamizhmani, Govindasamy
AU - Hacke, Peter
N1 - Funding Information:
This material is based upon work primarily supported by the National Science Foundation (NSF) and the Department of Energy (DOE) under NSF CA No. EEC-1041895. The partial funding support of DOE/SERIIUS is also appreciated. Any opinions, findings and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect those of NSF or DOE.
Publisher Copyright:
© 2017 IEEE.
PY - 2017
Y1 - 2017
N2 - Various characterization techniques have historically been developed in order to screen potential induced degradation (PID)-susceptible cells, but those techniques require final solar cells. We present a new characterization technique for screening PID-susceptible cells during the cell fabrication process. Illuminated Lock-In Thermography (ILIT) was used to image PID shunting of the cell without metallization and clearly showed PID-affected areas. PID-susceptible cells can be screened by ILIT, and the sample structure can advantageously be simplified as long as the sample has the silicon nitride antireflection coating and an aluminum back surface field.
AB - Various characterization techniques have historically been developed in order to screen potential induced degradation (PID)-susceptible cells, but those techniques require final solar cells. We present a new characterization technique for screening PID-susceptible cells during the cell fabrication process. Illuminated Lock-In Thermography (ILIT) was used to image PID shunting of the cell without metallization and clearly showed PID-affected areas. PID-susceptible cells can be screened by ILIT, and the sample structure can advantageously be simplified as long as the sample has the silicon nitride antireflection coating and an aluminum back surface field.
KW - Electroluminescence
KW - Lock-in thermography
KW - PID
KW - Photovoltaic cells
KW - Reliability
KW - Silicon
UR - http://www.scopus.com/inward/record.url?scp=85048462664&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85048462664&partnerID=8YFLogxK
U2 - 10.1109/PVSC.2017.8366151
DO - 10.1109/PVSC.2017.8366151
M3 - Conference contribution
AN - SCOPUS:85048462664
T3 - 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
SP - 1245
EP - 1247
BT - 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 44th IEEE Photovoltaic Specialist Conference, PVSC 2017
Y2 - 25 June 2017 through 30 June 2017
ER -