12 Citations (Scopus)

Abstract

A pulsed voltage bias method is proposed to eliminate the measurement artifacts of external quantum efficiency (EQE) of multi-junction solar cells. Under the DC voltage and light biases in the EQE measurements, the output current and voltage drops on the subcells under the chopped monochromatic light are affected by the low shunt resistances of the Ge subcells, which cause the EQE measurement artifacts for InGaP/InGaAs/Ge triple junction solar cells. A pulsed voltage bias superimposed on the DC voltage and light biases is used to properly control the output current and subcell voltages to eliminate the measurement artifacts. SPICE simulation confirms that the proposed method completely removes the measurement artifacts.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume8256
DOIs
StatePublished - 2012
EventPhysics, Simulation, and Photonic Engineering of Photovoltaic Devices - San Francisco, CA, United States
Duration: Jan 23 2012Jan 26 2012

Other

OtherPhysics, Simulation, and Photonic Engineering of Photovoltaic Devices
CountryUnited States
CitySan Francisco, CA
Period1/23/121/26/12

Fingerprint

Quantum Efficiency
shunts
Solar Cells
Quantum efficiency
artifacts
quantum efficiency
Eliminate
solar cells
Voltage
electric potential
Bias voltage
Electric potential
direct current
SPICE
InGaAs
output
Output
Solar cells
Multi-junction solar cells
causes

Keywords

  • Measurement artifacts
  • Pulsed voltage bias
  • Quantum efficiency
  • Shunt
  • Solar cells

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Li, J. J., Lim, S. H., & Zhang, Y-H. (2012). A novel method to eliminate the measurement artifacts of external quantum efficiency of multi-junction solar cells caused by the shunt effect. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 8256). [825616] https://doi.org/10.1117/12.912790

A novel method to eliminate the measurement artifacts of external quantum efficiency of multi-junction solar cells caused by the shunt effect. / Li, Jing Jing; Lim, Swee Hoe; Zhang, Yong-Hang.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8256 2012. 825616.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Li, JJ, Lim, SH & Zhang, Y-H 2012, A novel method to eliminate the measurement artifacts of external quantum efficiency of multi-junction solar cells caused by the shunt effect. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 8256, 825616, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices, San Francisco, CA, United States, 1/23/12. https://doi.org/10.1117/12.912790
Li, Jing Jing ; Lim, Swee Hoe ; Zhang, Yong-Hang. / A novel method to eliminate the measurement artifacts of external quantum efficiency of multi-junction solar cells caused by the shunt effect. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8256 2012.
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