A novel design of scanning tunneling microscopy and atomic force microscopy in one microscope

Tainwei Jing, Stuart Lindsay, Daphna R. Yaniv

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)155-157
Number of pages3
JournalScanning
Volume18
Issue number3
StatePublished - 1996

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Scanning tunneling microscopy
scanning tunneling microscopy
Atomic force microscopy
Microscopes
microscopes
atomic force microscopy

ASJC Scopus subject areas

  • Instrumentation

Cite this

A novel design of scanning tunneling microscopy and atomic force microscopy in one microscope. / Jing, Tainwei; Lindsay, Stuart; Yaniv, Daphna R.

In: Scanning, Vol. 18, No. 3, 1996, p. 155-157.

Research output: Contribution to journalArticle

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