A novel design of scanning tunneling microscopy and atomic force microscopy in one microscope

Tainwei Jing, Stuart Lindsay, Daphna R. Yaniv

Research output: Contribution to journal › Article › peer-review

ASJC Scopus subject areas

@article{a61a1409d8e94a90951200fa3324e75a,

title = "A novel design of scanning tunneling microscopy and atomic force microscopy in one microscope",

author = "Tainwei Jing and Stuart Lindsay and Yaniv, {Daphna R.}",

year = "1996",

language = "English (US)",

volume = "18",

pages = "155--157",

journal = "Scanning",

issn = "0161-0457",

publisher = "John Wiley and Sons Inc.",

number = "3",

}

TY - JOUR

T1 - A novel design of scanning tunneling microscopy and atomic force microscopy in one microscope

AU - Jing, Tainwei

AU - Lindsay, Stuart

AU - Yaniv, Daphna R.

PY - 1996

Y1 - 1996

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M3 - Article

AN - SCOPUS:3142543658

SN - 0161-0457

VL - 18

SP - 155

EP - 157

JO - Scanning

JF - Scanning

IS - 3

ER -