A novel backside gate structure to improve device performance

Y. H. Hwang, Weidi Zhu, Chen Dong, Shihyun Ahn, Fan Ren, Ivan I. Kravchenko, David Smith, Stephen J. Pearton

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'A novel backside gate structure to improve device performance'. Together they form a unique fingerprint.

Engineering & Materials Science