A novel approach to optimal accelerated life test planning with interval censoring

Tao Yang, Rong Pan

Research output: Contribution to journalArticlepeer-review

18 Scopus citations


Accelerated life testing (ALT) is widely used in industry to obtain the lifetime estimate of a product which is expected to last years or even decades. It is important to find an effective experimental design of ALT with the consideration of certain optimality criteria. In this paper, we discuss a new approach to designing ALT test plans when readout data (i.e., interval censoring) are collected. We utilize the proportional hazard (PH) model for a failure time distribution, and formulate a generalized linear model (GLM) for censored data. The optimal design is obtained such that the prediction variance of the expected product lifetime at the product's use condition is minimized.

Original languageEnglish (US)
Article number6497541
Pages (from-to)527-536
Number of pages10
JournalIEEE Transactions on Reliability
Issue number2
StatePublished - Apr 17 2013


  • Accelerated life testing
  • U-optimal design
  • generalized linear model
  • proportional hazard model
  • sensitivity analysis

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering


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