A new metric for fault-tolerance in sensor networks

Bin Hao, Arunabha Sen, Bao Hong Shen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

Faults in some sensor networks are likely to be localized. The conventional metric of fault-tolerance - connectivity of the network graph - fails to capture any notion of locality. This research introduces a new metric - region-based Connectivity - that incorporates the notion of locality.

Original languageEnglish (US)
Title of host publicationSenSys'04 - Proceedings of the Second International Conference on Embedded Networked Sensor Systems
Pages289-290
Number of pages2
StatePublished - Dec 1 2004
EventSenSys'04 - Proceedings of the Second International Conference on Embedded Networked Sensor Systems - Baltimore, MD, United States
Duration: Nov 3 2004Nov 5 2004

Publication series

NameSenSys'04 - Proceedings of the Second International Conference on Embedded Networked Sensor Systems

Conference

ConferenceSenSys'04 - Proceedings of the Second International Conference on Embedded Networked Sensor Systems
CountryUnited States
CityBaltimore, MD
Period11/3/0411/5/04

Keywords

  • Connectivity
  • Fault-tolerance
  • Region-based connectivity
  • Sensor network

ASJC Scopus subject areas

  • Engineering(all)
  • Computer Networks and Communications
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'A new metric for fault-tolerance in sensor networks'. Together they form a unique fingerprint.

  • Cite this

    Hao, B., Sen, A., & Shen, B. H. (2004). A new metric for fault-tolerance in sensor networks. In SenSys'04 - Proceedings of the Second International Conference on Embedded Networked Sensor Systems (pp. 289-290). (SenSys'04 - Proceedings of the Second International Conference on Embedded Networked Sensor Systems).