Abstract
In this letter, we present a 2x-site test solution for radio frequency transceivers using only baseband signals for analysis. We perform all operations on communication standard-compliant signal packets, thereby putting the device under the normal operating conditions. The transmitter on one device under test (DUT) is coupled with a receiver on another DUT to form a complete transmitter-to-receiver path. Parameters of the two devices are decoupled from one another by carefully modeling the system and using signal processing techniques. Simulation as well as measurement results confirm the high accuracy of the proposed technique.
Original language | English (US) |
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Article number | 5989986 |
Pages (from-to) | 1421-1425 |
Number of pages | 5 |
Journal | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
Volume | 30 |
Issue number | 9 |
DOIs | |
State | Published - Sep 2011 |
Keywords
- IQ imbalance
- RF test
- low cost
- multi-site test
- nonlinearity
ASJC Scopus subject areas
- Software
- Computer Graphics and Computer-Aided Design
- Electrical and Electronic Engineering