A Monte Carlo analysis of diffusion-noise properties in GaAs-AlGaAs quantum wells

Rossella Brunetti, Steven M. Goodnick

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a general analysis of steady-state velocity fluctuations, diffusion and noise for electrons in GaAs-AlGaAs quantum wells under high-field conditions using an Ensemble Monte Carlo simulation. Here we analyze for the first time diffusivity and noise problems in a two-dimensional structure by means of the velocity autocorrelation function. From the Monte Carlo simulation we obtain results for the diffusion coefficient at various field strengths and for the autocorrelation function of velocity fluctuations as a function of time for different physical conditions. We also show the power spectral density of velocity fluctuations as a function of frequency for such systems, and a comparison is made with the available data in the literature. The role of interband scattering, a new noise source not present in bulk structures, is discussed, together with the comparison between bulk and 2D results.

Original languageEnglish (US)
Title of host publicationESSDERC 1987 - 17th European Solid State Device Research Conference
PublisherIEEE Computer Society
Pages181-184
Number of pages4
ISBN (Electronic)0444704779
ISBN (Print)9780444704771
StatePublished - Jan 1 1987
Externally publishedYes
Event17th European Solid State Device Research Conference, ESSDERC 1987 - Bologna, Italy
Duration: Sep 14 1987Sep 17 1987

Publication series

NameEuropean Solid-State Device Research Conference
ISSN (Print)1930-8876

Other

Other17th European Solid State Device Research Conference, ESSDERC 1987
CountryItaly
CityBologna
Period9/14/879/17/87

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Brunetti, R., & Goodnick, S. M. (1987). A Monte Carlo analysis of diffusion-noise properties in GaAs-AlGaAs quantum wells. In ESSDERC 1987 - 17th European Solid State Device Research Conference (pp. 181-184). [5436613] (European Solid-State Device Research Conference). IEEE Computer Society.