TY - GEN
T1 - A model predictive control strategy for supply chain management in semiconductor manufacturing under uncertainty
AU - Wang, Wenlin
AU - Rivera, Daniel
AU - Kempf, Karl G.
AU - Smith, Kirk D.
PY - 2004
Y1 - 2004
N2 - Model Predictive Control (MPC) is presented as a tactical decision module for supply chain management in semiconductor manufacturing. A representative problem which includes distinguishing features of semiconductor manufacturing supply chains, such as material reconfiguration and stochastic product splits, is examined. Fluid analogies are used to model the supply chain dynamics, with stochasticity and nonlinearity occurring on the throughput time, yield and customer demand. Given inventory targets and capacity limits, MPC using linear time invariant models can make the system outputs track the targets and improve customer service levels. The flexibility provided by the choice of tuning parameters in MPC to achieve better performance and robustness in semiconductor manufacturing supply chain management is demonstrated.
AB - Model Predictive Control (MPC) is presented as a tactical decision module for supply chain management in semiconductor manufacturing. A representative problem which includes distinguishing features of semiconductor manufacturing supply chains, such as material reconfiguration and stochastic product splits, is examined. Fluid analogies are used to model the supply chain dynamics, with stochasticity and nonlinearity occurring on the throughput time, yield and customer demand. Given inventory targets and capacity limits, MPC using linear time invariant models can make the system outputs track the targets and improve customer service levels. The flexibility provided by the choice of tuning parameters in MPC to achieve better performance and robustness in semiconductor manufacturing supply chain management is demonstrated.
UR - http://www.scopus.com/inward/record.url?scp=8744260664&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=8744260664&partnerID=8YFLogxK
U2 - 10.1109/ACC.2004.182673
DO - 10.1109/ACC.2004.182673
M3 - Conference contribution
AN - SCOPUS:8744260664
SN - 0780383354
T3 - Proceedings of the American Control Conference
SP - 4577
EP - 4582
BT - Proceedings of the 2004 American Control Conference (AAC)
T2 - Proceedings of the 2004 American Control Conference (AAC)
Y2 - 30 June 2004 through 2 July 2004
ER -