A mechanism for online diagnosis of hard faults in microprocessors

Fred A. Bower, Daniel J. Sorin, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

60 Scopus citations

Abstract

We develop a microprocessor design that tolerates hard faults, including fabrication defects and in-field faults, by leveraging existing microprocessor redundancy. To do this, we must: detect and correct errors, diagnose hard faults at the field deconfigurable unit (FDU) granularity, and deconfigure FDUs with hard faults, In our reliable microprocessor design, we use DIVA dynamic verification to detect and correct errors. Our new scheme for diagnosing hard faults tracks instructions' core structure occupancy from decode until commit. If a DIVA checker detects an error in an instruction, it increments a small saturating error counter for every FDU used by that instruction, including that DIVA checker. A hard fault in an FDU quickly leads to an above-threshold error counter for that FDU and thus diagnoses the fault. For deconfiguration, we use previously developed schemes for functional units and buffers, and we present a scheme for deconfiguring DIVA checkers. Experimental results show that our reliable microprocessor quickly and accurately diagnoses each hard fault that is injected and continues to function, albeit with somewhat degraded performance.

Original languageEnglish (US)
Title of host publicationMICRO-38
Subtitle of host publicationProceedings of the 38th Annual IEEE/ACM International Symposium on Microarchitecture
Pages197-208
Number of pages12
DOIs
StatePublished - Dec 1 2005
EventMICRO-38: 38th Annual IEEE/ACM International Symposium on Microarchitecture - Barcelona, Spain
Duration: Nov 12 2005Nov 16 2005

Publication series

NameProceedings of the Annual International Symposium on Microarchitecture, MICRO
ISSN (Print)1072-4451

Other

OtherMICRO-38: 38th Annual IEEE/ACM International Symposium on Microarchitecture
CountrySpain
CityBarcelona
Period11/12/0511/16/05

    Fingerprint

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Bower, F. A., Sorin, D. J., & Ozev, S. (2005). A mechanism for online diagnosis of hard faults in microprocessors. In MICRO-38: Proceedings of the 38th Annual IEEE/ACM International Symposium on Microarchitecture (pp. 197-208). [1540960] (Proceedings of the Annual International Symposium on Microarchitecture, MICRO). https://doi.org/10.1109/MICRO.2005.8