A low-cost RF MIMO test method using a single measurement set-up

Erkan Acar, Sule Ozev, Kevin B. Redmond

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations


Multiple Input Multiple Output (MIMO) based systems have recently received a lot of attention as their projected data rate is twice as fast as the currently available systems. Due to the increased number of RF paths, the testing becomes more complicated, thereby increasing the overall test cost of these devices. In this paper, we propose a low cost MIMO test solution which targets critical specifications that are fundamental to the MIMO system operation, such as gain, II P3, and phase imbalances between the RF paths. Our test methodology measures these parameters with a single test setup that enables the calculation of the relevant performance parameters. Using the proposed test method RF MIMO systems can be tested using a mixed signal tester, and on-board circuitry with a reasonable accuracy. Both simulation and measurement results confirm the high accuracy and repeatability of our test technique.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE VLSI Test Symposium
Number of pages6
Publication statusPublished - 2007
Externally publishedYes
Event25th IEEE VLSI Test Symposium, VTS'07 - Berkeley, CA, United States
Duration: May 6 2007May 10 2007


Other25th IEEE VLSI Test Symposium, VTS'07
CountryUnited States
CityBerkeley, CA


ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Acar, E., Ozev, S., & Redmond, K. B. (2007). A low-cost RF MIMO test method using a single measurement set-up. In Proceedings of the IEEE VLSI Test Symposium (pp. 3-8). [4209883] https://doi.org/10.1109/VTS.2007.6