A low-cost RF MIMO test method using a single measurement set-up

Erkan Acar; Sule Ozev; Kevin B. Redmond

doi:10.1109/VTS.2007.6

A low-cost RF MIMO test method using a single measurement set-up

Erkan Acar, Sule Ozev, Kevin B. Redmond

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

6 Scopus citations

Abstract

Multiple Input Multiple Output (MIMO) based systems have recently received a lot of attention as their projected data rate is twice as fast as the currently available systems. Due to the increased number of RF paths, the testing becomes more complicated, thereby increasing the overall test cost of these devices. In this paper, we propose a low cost MIMO test solution which targets critical specifications that are fundamental to the MIMO system operation, such as gain, II P₃, and phase imbalances between the RF paths. Our test methodology measures these parameters with a single test setup that enables the calculation of the relevant performance parameters. Using the proposed test method RF MIMO systems can be tested using a mixed signal tester, and on-board circuitry with a reasonable accuracy. Both simulation and measurement results confirm the high accuracy and repeatability of our test technique.

Original language	English (US)
Title of host publication	Proceedings - 25th IEEE VLSI Test Symposium, VTS'07
Pages	3-8
Number of pages	6
DOIs	https://doi.org/10.1109/VTS.2007.6
State	Published - 2007
Externally published	Yes
Event	25th IEEE VLSI Test Symposium, VTS'07 - Berkeley, CA, United States Duration: May 6 2007 → May 10 2007

Publication series

Name	Proceedings of the IEEE VLSI Test Symposium

Other

Other	25th IEEE VLSI Test Symposium, VTS'07
Country/Territory	United States
City	Berkeley, CA
Period	5/6/07 → 5/10/07

ASJC Scopus subject areas

Computer Science Applications
Electrical and Electronic Engineering

Access to Document

10.1109/VTS.2007.6

Cite this

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title = "A low-cost RF MIMO test method using a single measurement set-up",

abstract = "Multiple Input Multiple Output (MIMO) based systems have recently received a lot of attention as their projected data rate is twice as fast as the currently available systems. Due to the increased number of RF paths, the testing becomes more complicated, thereby increasing the overall test cost of these devices. In this paper, we propose a low cost MIMO test solution which targets critical specifications that are fundamental to the MIMO system operation, such as gain, II P3, and phase imbalances between the RF paths. Our test methodology measures these parameters with a single test setup that enables the calculation of the relevant performance parameters. Using the proposed test method RF MIMO systems can be tested using a mixed signal tester, and on-board circuitry with a reasonable accuracy. Both simulation and measurement results confirm the high accuracy and repeatability of our test technique.",

author = "Erkan Acar and Sule Ozev and Redmond, {Kevin B.}",

year = "2007",

doi = "10.1109/VTS.2007.6",

language = "English (US)",

isbn = "0769528120",

series = "Proceedings of the IEEE VLSI Test Symposium",

pages = "3--8",

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note = "25th IEEE VLSI Test Symposium, VTS'07 ; Conference date: 06-05-2007 Through 10-05-2007",

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AU - Acar, Erkan

AU - Ozev, Sule

AU - Redmond, Kevin B.

PY - 2007

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N2 - Multiple Input Multiple Output (MIMO) based systems have recently received a lot of attention as their projected data rate is twice as fast as the currently available systems. Due to the increased number of RF paths, the testing becomes more complicated, thereby increasing the overall test cost of these devices. In this paper, we propose a low cost MIMO test solution which targets critical specifications that are fundamental to the MIMO system operation, such as gain, II P3, and phase imbalances between the RF paths. Our test methodology measures these parameters with a single test setup that enables the calculation of the relevant performance parameters. Using the proposed test method RF MIMO systems can be tested using a mixed signal tester, and on-board circuitry with a reasonable accuracy. Both simulation and measurement results confirm the high accuracy and repeatability of our test technique.

AB - Multiple Input Multiple Output (MIMO) based systems have recently received a lot of attention as their projected data rate is twice as fast as the currently available systems. Due to the increased number of RF paths, the testing becomes more complicated, thereby increasing the overall test cost of these devices. In this paper, we propose a low cost MIMO test solution which targets critical specifications that are fundamental to the MIMO system operation, such as gain, II P3, and phase imbalances between the RF paths. Our test methodology measures these parameters with a single test setup that enables the calculation of the relevant performance parameters. Using the proposed test method RF MIMO systems can be tested using a mixed signal tester, and on-board circuitry with a reasonable accuracy. Both simulation and measurement results confirm the high accuracy and repeatability of our test technique.

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T3 - Proceedings of the IEEE VLSI Test Symposium

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BT - Proceedings - 25th IEEE VLSI Test Symposium, VTS'07

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A low-cost RF MIMO test method using a single measurement set-up

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