TY - GEN
T1 - A hybrid technique for facial feature point detection
AU - Gargesha, M.
AU - Panchanathan, Sethuraman
N1 - Publisher Copyright:
© 2002 IEEE.
PY - 2002
Y1 - 2002
N2 - Existing techniques for facial feature point detection from color images include template matching, facial geometry and symmetry analysis, mathematical morphology, luminance and chrominance analysis, and PCA. However, these techniques are plagued by poor performance in the presence of scale variations. In this paper, a hybrid technique is proposed that employs a combination of the above approaches along with curvature analysis of the intensity surface of the face image in order to provide a superior performance with reduced computational complexity, even in the presence of scale variations.
AB - Existing techniques for facial feature point detection from color images include template matching, facial geometry and symmetry analysis, mathematical morphology, luminance and chrominance analysis, and PCA. However, these techniques are plagued by poor performance in the presence of scale variations. In this paper, a hybrid technique is proposed that employs a combination of the above approaches along with curvature analysis of the intensity surface of the face image in order to provide a superior performance with reduced computational complexity, even in the presence of scale variations.
KW - Computational complexity
KW - Eyes
KW - Face detection
KW - Facial features
KW - Image analysis
KW - Image color analysis
KW - Image edge detection
KW - Nose
KW - Performance analysis
KW - Principal component analysis
UR - http://www.scopus.com/inward/record.url?scp=84948396476&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84948396476&partnerID=8YFLogxK
U2 - 10.1109/IAI.2002.999905
DO - 10.1109/IAI.2002.999905
M3 - Conference contribution
AN - SCOPUS:84948396476
T3 - Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation
SP - 134
EP - 138
BT - Proceedings - 5th IEEE Southwest Symposium on Image Analysis and Interpretation, SSIAI 2002
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 5th IEEE Southwest Symposium on Image Analysis and Interpretation, SSIAI 2002
Y2 - 7 April 2002 through 9 April 2002
ER -