A history-based dynamic random software testing

Lei Zhang, Bei Bei Yin, Junpeng Lv, Kai Yuan Cai, Sik-Sang Yau, Jia Yu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

Following the idea of software cybernetics, Dynamic Random Testing (DRT) was proposed to improve the traditional random testing and random-partition testing strategies. The essential idea of Dynamic Random Testing is to update the testing profile dynamically during the software testing according to test data collected online. As a result, the sub domains which have higher defect detection rate are selected more easily. There are some shortcomings in the original DRT, such as it is not rigorous to update the testing profile each time merely according to whether a test case reveals defects or not. In order to overcome the shortcomings in the original DRT, a History-based Dynamic Random Testing is proposed on the basis of DRT and it is denoted as DRT-h. In DRT-h strategy, the estimate of the defect detection rate of each sub domain is calculated in real-time during the software testing by using history testing information. In this paper some real-life software were used to verify the effect of DRT and DRT-h, and the experiments show that DRT-h outperforms random testing, random-partition testing and Dynamic Random Testing greatly.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages31-36
Number of pages6
ISBN (Print)9781479935789
DOIs
StatePublished - Sep 18 2014
Event38th Annual IEEE Computer Software and Applications Conference Workshops, COMPSACW 2014 - Vasteras, Sweden
Duration: Jul 27 2014Jul 29 2014

Other

Other38th Annual IEEE Computer Software and Applications Conference Workshops, COMPSACW 2014
CountrySweden
CityVasteras
Period7/27/147/29/14

Fingerprint

Software testing
Testing
Cybernetics

Keywords

  • history-based dynamic random testing
  • random testing
  • software cybernetic
  • testing profile

ASJC Scopus subject areas

  • Computer Science Applications
  • Software

Cite this

Zhang, L., Yin, B. B., Lv, J., Cai, K. Y., Yau, S-S., & Yu, J. (2014). A history-based dynamic random software testing. In Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014 (pp. 31-36). [6903101] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/COMPSACW.2014.9

A history-based dynamic random software testing. / Zhang, Lei; Yin, Bei Bei; Lv, Junpeng; Cai, Kai Yuan; Yau, Sik-Sang; Yu, Jia.

Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014. Institute of Electrical and Electronics Engineers Inc., 2014. p. 31-36 6903101.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zhang, L, Yin, BB, Lv, J, Cai, KY, Yau, S-S & Yu, J 2014, A history-based dynamic random software testing. in Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014., 6903101, Institute of Electrical and Electronics Engineers Inc., pp. 31-36, 38th Annual IEEE Computer Software and Applications Conference Workshops, COMPSACW 2014, Vasteras, Sweden, 7/27/14. https://doi.org/10.1109/COMPSACW.2014.9
Zhang L, Yin BB, Lv J, Cai KY, Yau S-S, Yu J. A history-based dynamic random software testing. In Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014. Institute of Electrical and Electronics Engineers Inc. 2014. p. 31-36. 6903101 https://doi.org/10.1109/COMPSACW.2014.9
Zhang, Lei ; Yin, Bei Bei ; Lv, Junpeng ; Cai, Kai Yuan ; Yau, Sik-Sang ; Yu, Jia. / A history-based dynamic random software testing. Proceedings - IEEE 38th Annual International Computers, Software and Applications Conference Workshops, COMPSACW 2014. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 31-36
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