A high‐resolution electron microscopic study of defects in sodium β′″‐alumina

R. Hull, David Smith, C. J. Humphreys

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

A high‐resolution electron‐microscopic study of sodium β′″‐alumina, a polytype of the more‐widely‐studied sodium β‐ and β″‐alumina, has been undertaken using the 600 kV instrument at Cambridge University. Images revealed the loss of sodium‐containing planes, which had caused crystals to collapse and shear into defect layers. A model for the structure of these defects is proposed, based on the use of computed images and by comparison with high‐resolution images of silver β″‐alumina. 1983 Blackwell Science Ltd

Original languageEnglish (US)
Pages (from-to)203-214
Number of pages12
JournalJournal of Microscopy
Volume130
Issue number2
DOIs
StatePublished - 1983
Externally publishedYes

Fingerprint

Aluminum Oxide
Sodium
Electrons
Silver

Keywords

  • conduction planes
  • High resolution electron microscopy
  • image simulations
  • sodium β‐alumina
  • structure imaging
  • superionic conductors

ASJC Scopus subject areas

  • Pathology and Forensic Medicine
  • Histology

Cite this

A high‐resolution electron microscopic study of defects in sodium β′″‐alumina. / Hull, R.; Smith, David; Humphreys, C. J.

In: Journal of Microscopy, Vol. 130, No. 2, 1983, p. 203-214.

Research output: Contribution to journalArticle

@article{66613258290d491a8b4be59b7249aed6,
title = "A high‐resolution electron microscopic study of defects in sodium β′″‐alumina",
abstract = "A high‐resolution electron‐microscopic study of sodium β′″‐alumina, a polytype of the more‐widely‐studied sodium β‐ and β″‐alumina, has been undertaken using the 600 kV instrument at Cambridge University. Images revealed the loss of sodium‐containing planes, which had caused crystals to collapse and shear into defect layers. A model for the structure of these defects is proposed, based on the use of computed images and by comparison with high‐resolution images of silver β″‐alumina. 1983 Blackwell Science Ltd",
keywords = "conduction planes, High resolution electron microscopy, image simulations, sodium β‐alumina, structure imaging, superionic conductors",
author = "R. Hull and David Smith and Humphreys, {C. J.}",
year = "1983",
doi = "10.1111/j.1365-2818.1983.tb04218.x",
language = "English (US)",
volume = "130",
pages = "203--214",
journal = "Journal of Microscopy",
issn = "0022-2720",
publisher = "Wiley-Blackwell",
number = "2",

}

TY - JOUR

T1 - A high‐resolution electron microscopic study of defects in sodium β′″‐alumina

AU - Hull, R.

AU - Smith, David

AU - Humphreys, C. J.

PY - 1983

Y1 - 1983

N2 - A high‐resolution electron‐microscopic study of sodium β′″‐alumina, a polytype of the more‐widely‐studied sodium β‐ and β″‐alumina, has been undertaken using the 600 kV instrument at Cambridge University. Images revealed the loss of sodium‐containing planes, which had caused crystals to collapse and shear into defect layers. A model for the structure of these defects is proposed, based on the use of computed images and by comparison with high‐resolution images of silver β″‐alumina. 1983 Blackwell Science Ltd

AB - A high‐resolution electron‐microscopic study of sodium β′″‐alumina, a polytype of the more‐widely‐studied sodium β‐ and β″‐alumina, has been undertaken using the 600 kV instrument at Cambridge University. Images revealed the loss of sodium‐containing planes, which had caused crystals to collapse and shear into defect layers. A model for the structure of these defects is proposed, based on the use of computed images and by comparison with high‐resolution images of silver β″‐alumina. 1983 Blackwell Science Ltd

KW - conduction planes

KW - High resolution electron microscopy

KW - image simulations

KW - sodium β‐alumina

KW - structure imaging

KW - superionic conductors

UR - http://www.scopus.com/inward/record.url?scp=84985297658&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84985297658&partnerID=8YFLogxK

U2 - 10.1111/j.1365-2818.1983.tb04218.x

DO - 10.1111/j.1365-2818.1983.tb04218.x

M3 - Article

AN - SCOPUS:84985297658

VL - 130

SP - 203

EP - 214

JO - Journal of Microscopy

JF - Journal of Microscopy

SN - 0022-2720

IS - 2

ER -