A highly integrated 65-nm SoC process with enhanced power/performance of digital and analog circuits

L. T. Clark, D. Zhao, T. Bakhishev, H. Ahn, E. Boling, M. Duane, K. Fujita, P. Gregory, T. Hoffmann, M. Hori, D. Kanai, D. Kidd, S. Lee, Y. Liu, J. Mitani, J. Nagayama, S. Pradhan, P. Ranade, R. Rogenmoser, L. Scudder & 6 others L. Shifren, Y. Torii, M. Wojko, Y. Asada, T. Ema, S. Thompson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

65nm Deeply Depleted Channel (DDCTM) transistors have been fabricated with a halo-free, un-doped epitaxial channel and enable reduced threshold voltage (VT) variation, lower supply voltage (V CC), enhanced body effect and IEFF. Digital circuits made using this technology show benefits ranging from 47% power reduction to 38% frequency increase. Analog circuits exhibit 4x greater amplifier gain despite lower VDD, and current mirror mismatch (both global and local) shows 40% and 30% reduction for NMOS and PMOS, respectively.

Original languageEnglish (US)
Title of host publicationTechnical Digest - International Electron Devices Meeting, IEDM
DOIs
StatePublished - 2012
Externally publishedYes
Event2012 IEEE International Electron Devices Meeting, IEDM 2012 - San Francisco, CA, United States
Duration: Dec 10 2012Dec 13 2012

Other

Other2012 IEEE International Electron Devices Meeting, IEDM 2012
CountryUnited States
CitySan Francisco, CA
Period12/10/1212/13/12

Fingerprint

systems-on-a-chip
analog circuits
digital electronics
Digital circuits
Analog circuits
Threshold voltage
threshold voltage
halos
Transistors
Mirrors
transistors
amplifiers
mirrors
Electric potential
electric potential
System-on-chip

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry

Cite this

Clark, L. T., Zhao, D., Bakhishev, T., Ahn, H., Boling, E., Duane, M., ... Thompson, S. (2012). A highly integrated 65-nm SoC process with enhanced power/performance of digital and analog circuits. In Technical Digest - International Electron Devices Meeting, IEDM [6479042] https://doi.org/10.1109/IEDM.2012.6479042

A highly integrated 65-nm SoC process with enhanced power/performance of digital and analog circuits. / Clark, L. T.; Zhao, D.; Bakhishev, T.; Ahn, H.; Boling, E.; Duane, M.; Fujita, K.; Gregory, P.; Hoffmann, T.; Hori, M.; Kanai, D.; Kidd, D.; Lee, S.; Liu, Y.; Mitani, J.; Nagayama, J.; Pradhan, S.; Ranade, P.; Rogenmoser, R.; Scudder, L.; Shifren, L.; Torii, Y.; Wojko, M.; Asada, Y.; Ema, T.; Thompson, S.

Technical Digest - International Electron Devices Meeting, IEDM. 2012. 6479042.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Clark, LT, Zhao, D, Bakhishev, T, Ahn, H, Boling, E, Duane, M, Fujita, K, Gregory, P, Hoffmann, T, Hori, M, Kanai, D, Kidd, D, Lee, S, Liu, Y, Mitani, J, Nagayama, J, Pradhan, S, Ranade, P, Rogenmoser, R, Scudder, L, Shifren, L, Torii, Y, Wojko, M, Asada, Y, Ema, T & Thompson, S 2012, A highly integrated 65-nm SoC process with enhanced power/performance of digital and analog circuits. in Technical Digest - International Electron Devices Meeting, IEDM., 6479042, 2012 IEEE International Electron Devices Meeting, IEDM 2012, San Francisco, CA, United States, 12/10/12. https://doi.org/10.1109/IEDM.2012.6479042
Clark LT, Zhao D, Bakhishev T, Ahn H, Boling E, Duane M et al. A highly integrated 65-nm SoC process with enhanced power/performance of digital and analog circuits. In Technical Digest - International Electron Devices Meeting, IEDM. 2012. 6479042 https://doi.org/10.1109/IEDM.2012.6479042
Clark, L. T. ; Zhao, D. ; Bakhishev, T. ; Ahn, H. ; Boling, E. ; Duane, M. ; Fujita, K. ; Gregory, P. ; Hoffmann, T. ; Hori, M. ; Kanai, D. ; Kidd, D. ; Lee, S. ; Liu, Y. ; Mitani, J. ; Nagayama, J. ; Pradhan, S. ; Ranade, P. ; Rogenmoser, R. ; Scudder, L. ; Shifren, L. ; Torii, Y. ; Wojko, M. ; Asada, Y. ; Ema, T. ; Thompson, S. / A highly integrated 65-nm SoC process with enhanced power/performance of digital and analog circuits. Technical Digest - International Electron Devices Meeting, IEDM. 2012.
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AU - Clark, L. T.

AU - Zhao, D.

AU - Bakhishev, T.

AU - Ahn, H.

AU - Boling, E.

AU - Duane, M.

AU - Fujita, K.

AU - Gregory, P.

AU - Hoffmann, T.

AU - Hori, M.

AU - Kanai, D.

AU - Kidd, D.

AU - Lee, S.

AU - Liu, Y.

AU - Mitani, J.

AU - Nagayama, J.

AU - Pradhan, S.

AU - Ranade, P.

AU - Rogenmoser, R.

AU - Scudder, L.

AU - Shifren, L.

AU - Torii, Y.

AU - Wojko, M.

AU - Asada, Y.

AU - Ema, T.

AU - Thompson, S.

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