A general recursion method for calculating diffracted intensities from crystals containing planar faults

Michael Treacy, J. M. Newsam, M. W. Deem

Research output: Chapter in Book/Report/Conference proceedingChapter

561 Scopus citations

Abstract

The method exploits the self-similar stacking sequences that occur when layers stack non-deterministically. Recursion gives a set of simple relations between average interference terms from a statistical crystal, which can be solved as a set of simultaneous equations. The diffracted intensity for a polycrystalline sample is given by the incoherent sum of scattered intensities over an ensemble of crystallites. The relations between this and previous approaches are discussed. Calculations for diamond-lonsdaleite and for several synthetic zeolite systems that contain high densities of stacking faults are presented as examples. -from Authors

Original languageEnglish (US)
Title of host publicationProceedings - Royal Society of London, A
Pages499-520
Number of pages22
Volume433
Edition1889
StatePublished - 1991
Externally publishedYes

ASJC Scopus subject areas

  • Earth and Planetary Sciences(all)
  • Environmental Science(all)

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