A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision

T. Copani, B. Vermeire, A. Jain, H. Karaki, K. Chandrashekar, S. Goswami, Jennifer Kitchen, H. H. Chung, I. Deligoz, Bertan Bakkaloglu, Hugh Barnaby, Sayfe Kiaei

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

A monolithic pulsed time-of-flight measurement system is presented in this paper. The circuit consists of an optical receiver front-end and time-to-digital converter. Received pulse amplitude detectors are also included to correct measurement for walk error. The IC is fabricated in a 0.18-μm BiCMOS process. The receiver front-end achieves a 2.3GHz bandwidth and NF lower than SdB. The system shows a single-shot precision of 12ps and a measurement range of 188us. The measurement rate can be as high as 700kHz. The power consumption is 148mA from a 3.5V supply for analog and E 2CL circuitry, and a 1.8V supply for CMOS circuitry.

Original languageEnglish (US)
Title of host publicationProceedings of the Custom Integrated Circuits Conference
Pages359-362
Number of pages4
DOIs
Publication statusPublished - 2008
EventIEEE 2008 Custom Integrated Circuits Conference, CICC 2008 - San Jose, CA, United States
Duration: Sep 21 2008Sep 24 2008

Other

OtherIEEE 2008 Custom Integrated Circuits Conference, CICC 2008
CountryUnited States
CitySan Jose, CA
Period9/21/089/24/08

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Copani, T., Vermeire, B., Jain, A., Karaki, H., Chandrashekar, K., Goswami, S., ... Kiaei, S. (2008). A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision. In Proceedings of the Custom Integrated Circuits Conference (pp. 359-362). [4672096] https://doi.org/10.1109/CICC.2008.4672096