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A free electron laser-photoemission electron microscope system (FEL-PEEM)
H. Ade, W. Yang, S. L. English, J. Hartman, R. F. Davis, R. J. Nemanich, V. N. Litvinenko, I. V. Pinayev, Y. Wu, J. M.J. Madey, V. N. Litvinenko, I. V. Pinayev, Y. Wu, J. M.J. Madey
Research output: Contribution to journal › Article › peer-review
62
Scopus
citations