A free electron laser-photoemission electron microscope system (FEL-PEEM)

H. Ade; W. Yang; S. L. English; J. Hartman; R. F. Davis; R. J. Nemanich; V. N. Litvinenko; I. V. Pinayev; Y. Wu; J. M.J. Madey; V. N. Litvinenko; I. V. Pinayev; Y. Wu; J. M.J. Madey

doi:10.1142/S0218625X98001596

A free electron laser-photoemission electron microscope system (FEL-PEEM)

H. Ade, W. Yang, S. L. English, J. Hartman, R. F. Davis, R. J. Nemanich, V. N. Litvinenko, I. V. Pinayev, Y. Wu, J. M.J. Madey, V. N. Litvinenko, I. V. Pinayev, Y. Wu, J. M.J. Madey

Research output: Contribution to journal › Article › peer-review

62 Scopus citations

Abstract

We report first results from our effort to couple a high resolution photoemission electron microscope (PEEM) to the OK-4 ultraviolet free electron laser at Duke University (OK-4/Duke UV FEL). The OK-4/Duke UV PEL is a high intensity source of tunable monochromatic photons in the 3-10 eV energy range. This tunability is unique and allows us to operate near the photoemission threshold of any samples and thus maximize sample contrast while keeping chromatic aberrations in the PEEM minimal. We have recorded first Images from a variety of samples using spontaneous radiation from the OK-4/Duke UV PEL in the photon energy range of 4.0-6.5 eV. Due to different photothreshold emission from different sample areas, emission from these areas could be turned on (or off) selectively. We have also observed relative intensity reversal with changes in photon energy which are interpreted as density-of-state contrast. Usable image quality has been achieved, even though the output power of the FEL in spontaneous emission mode was several orders of magnitude lower than the anticipated full laser power. The PEEM has achieved a spatial resolution of 12 nm.

Original language	English (US)
Pages (from-to)	1257-1268
Number of pages	12
Journal	Surface Review and Letters
Volume	5
Issue number	6
DOIs	https://doi.org/10.1142/S0218625X98001596
State	Published - 1998
Externally published	Yes

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1142/S0218625X98001596

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title = "A free electron laser-photoemission electron microscope system (FEL-PEEM)",

abstract = "We report first results from our effort to couple a high resolution photoemission electron microscope (PEEM) to the OK-4 ultraviolet free electron laser at Duke University (OK-4/Duke UV FEL). The OK-4/Duke UV PEL is a high intensity source of tunable monochromatic photons in the 3-10 eV energy range. This tunability is unique and allows us to operate near the photoemission threshold of any samples and thus maximize sample contrast while keeping chromatic aberrations in the PEEM minimal. We have recorded first Images from a variety of samples using spontaneous radiation from the OK-4/Duke UV PEL in the photon energy range of 4.0-6.5 eV. Due to different photothreshold emission from different sample areas, emission from these areas could be turned on (or off) selectively. We have also observed relative intensity reversal with changes in photon energy which are interpreted as density-of-state contrast. Usable image quality has been achieved, even though the output power of the FEL in spontaneous emission mode was several orders of magnitude lower than the anticipated full laser power. The PEEM has achieved a spatial resolution of 12 nm.",

author = "H. Ade and W. Yang and English, {S. L.} and J. Hartman and Davis, {R. F.} and Nemanich, {R. J.} and Litvinenko, {V. N.} and Pinayev, {I. V.} and Y. Wu and Madey, {J. M.J.} and Litvinenko, {V. N.} and Pinayev, {I. V.} and Y. Wu and Madey, {J. M.J.}",

year = "1998",

doi = "10.1142/S0218625X98001596",

language = "English (US)",

volume = "5",

pages = "1257--1268",

journal = "Surface Review and Letters",

issn = "0218-625X",

publisher = "World Scientific Publishing Co. Pte Ltd",

number = "6",

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TY - JOUR

T1 - A free electron laser-photoemission electron microscope system (FEL-PEEM)

AU - Ade, H.

AU - Yang, W.

AU - English, S. L.

AU - Hartman, J.

AU - Davis, R. F.

AU - Nemanich, R. J.

AU - Litvinenko, V. N.

AU - Pinayev, I. V.

AU - Wu, Y.

AU - Madey, J. M.J.

AU - Litvinenko, V. N.

AU - Pinayev, I. V.

AU - Wu, Y.

AU - Madey, J. M.J.

PY - 1998

Y1 - 1998

N2 - We report first results from our effort to couple a high resolution photoemission electron microscope (PEEM) to the OK-4 ultraviolet free electron laser at Duke University (OK-4/Duke UV FEL). The OK-4/Duke UV PEL is a high intensity source of tunable monochromatic photons in the 3-10 eV energy range. This tunability is unique and allows us to operate near the photoemission threshold of any samples and thus maximize sample contrast while keeping chromatic aberrations in the PEEM minimal. We have recorded first Images from a variety of samples using spontaneous radiation from the OK-4/Duke UV PEL in the photon energy range of 4.0-6.5 eV. Due to different photothreshold emission from different sample areas, emission from these areas could be turned on (or off) selectively. We have also observed relative intensity reversal with changes in photon energy which are interpreted as density-of-state contrast. Usable image quality has been achieved, even though the output power of the FEL in spontaneous emission mode was several orders of magnitude lower than the anticipated full laser power. The PEEM has achieved a spatial resolution of 12 nm.

AB - We report first results from our effort to couple a high resolution photoemission electron microscope (PEEM) to the OK-4 ultraviolet free electron laser at Duke University (OK-4/Duke UV FEL). The OK-4/Duke UV PEL is a high intensity source of tunable monochromatic photons in the 3-10 eV energy range. This tunability is unique and allows us to operate near the photoemission threshold of any samples and thus maximize sample contrast while keeping chromatic aberrations in the PEEM minimal. We have recorded first Images from a variety of samples using spontaneous radiation from the OK-4/Duke UV PEL in the photon energy range of 4.0-6.5 eV. Due to different photothreshold emission from different sample areas, emission from these areas could be turned on (or off) selectively. We have also observed relative intensity reversal with changes in photon energy which are interpreted as density-of-state contrast. Usable image quality has been achieved, even though the output power of the FEL in spontaneous emission mode was several orders of magnitude lower than the anticipated full laser power. The PEEM has achieved a spatial resolution of 12 nm.

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A free electron laser-photoemission electron microscope system (FEL-PEEM)

Abstract

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