TY - GEN
T1 - A framework for estimating NBTI degradation of microarchitectural components
AU - Debole, Michael
AU - Ramakrishnan, K.
AU - Balakrishnan, Varsha
AU - Wang, Wenping
AU - Luo, Hong
AU - Wang, Yu
AU - Xie, Yuan
AU - Cao, Yu
AU - Vijaykrishnan, N.
PY - 2009
Y1 - 2009
N2 - Degradation of device parameters over the lifetime of a system is emerging as a significant threat to system reliability. Among the aging mechanisms, wearout resulting from NBTI is of particular concern in deep submicron technology generations. To facilitate architectural level aging analysis, a tool capable of evaluating NBTI vulnerabilities early in the design cycle has been developed. The tool includes workload-based temperature and performance degradation analysis across a variety of technologies and operating conditions, revealing a complex interplay between factors influencing NBTI timing degradation.
AB - Degradation of device parameters over the lifetime of a system is emerging as a significant threat to system reliability. Among the aging mechanisms, wearout resulting from NBTI is of particular concern in deep submicron technology generations. To facilitate architectural level aging analysis, a tool capable of evaluating NBTI vulnerabilities early in the design cycle has been developed. The tool includes workload-based temperature and performance degradation analysis across a variety of technologies and operating conditions, revealing a complex interplay between factors influencing NBTI timing degradation.
UR - http://www.scopus.com/inward/record.url?scp=64549086727&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=64549086727&partnerID=8YFLogxK
U2 - 10.1109/ASPDAC.2009.4796522
DO - 10.1109/ASPDAC.2009.4796522
M3 - Conference contribution
AN - SCOPUS:64549086727
SN - 9781424427482
T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
SP - 455
EP - 460
BT - Proceedings of the ASP-DAC 2009
T2 - Asia and South Pacific Design Automation Conference 2009, ASP-DAC 2009
Y2 - 19 January 2009 through 22 January 2009
ER -