A Flash-based Current-mode IC to Realize Quantized Neural Networks

Kyler R. Scott, Cheng Yen Lee, Sunil P. Khatri, Sarma Vrudhula

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

This paper presents a mixed-signal architecture for implementing Quantized Neural Networks (QNNs) using flash transistors to achieve extremely high throughput with extremely low power, energy and memory requirements. Its low resource consumption makes our design especially suited for use in edge devices. The network weights are stored in-memory using flash transistors, and nodes perform operations in the analog current domain. Our design can be programmed with any QNN whose hyperparameters (the number of layers, filters, or filter size, etc) do not exceed the maximum provisioned. Once the flash devices are programmed with a trained model and the IC is given an input, our architecture performs inference with zero access to off-chip memory. We demonstrate the robustness of our design under current-mode non-linearities arising from process and voltage variations. We test validation accuracy on the ImageNet dataset, and show that our IC suffers only 0.6% and 1.0% reduction in classification accuracy for Top-1 and Top-5 outputs, respectively. Our implementation results in a sim boldsymbol {50}times reduction in latency and energy when compared to a recently published mixed-signal ASIC implementation, with similar power characteristics. Our approach provides layer partitioning and node sharing possibilities, which allow us to trade off latency, power, and area amongst each other.

Original languageEnglish (US)
Title of host publicationProceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022
EditorsCristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1029-1034
Number of pages6
ISBN (Electronic)9783981926361
DOIs
StatePublished - 2022
Event2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 - Virtual, Online, Belgium
Duration: Mar 14 2022Mar 23 2022

Publication series

NameProceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022

Conference

Conference2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022
Country/TerritoryBelgium
CityVirtual, Online
Period3/14/223/23/22

Keywords

  • Current-mode Circuits
  • Floating-gate Transistors
  • Quantized Neural Networks

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Networks and Communications
  • Hardware and Architecture
  • Software
  • Safety, Risk, Reliability and Quality
  • Control and Optimization

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