A fast and accurate approach for full chip leakage analysis of nano-scale circuits considering intra-die correlations

Sarvesh Bhardwaj, Sarma Vrudhula

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Fingerprint

Dive into the research topics of 'A fast and accurate approach for full chip leakage analysis of nano-scale circuits considering intra-die correlations'. Together they form a unique fingerprint.

Engineering & Materials Science