A dynamic system regulation measure for increasing effective capacity

the X-factor theory

D. Delp, Jennie Si, Y. Hwang, Ker-Wei Pei

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Due to the complex nature of semiconductor manufacturing it is evident that a single scheduling or regulation technique cannot best optimize the system dynamics for reducing cycle time and increasing throughput. The throughput of the system can increase to the effective capacity level of the system. When the throughput of the system approaches the effective capacity the product cycle time can dramatically increase. The "knee" of the performance curve indicates an operating point for fabs to maximize throughput while keeping the product cycle time relatively low. By increasing the effective capacity, i.e. adding a machine or improving a process, the product cycle time can be lowered or the system throughput increased by producing a shift in the "knee" of the performance curve. The bottleneck, typically defined as the most heavily utilized machine group, is often the target for increasing the system effective capacity. We will analyze the bottleneck along with other system capacity regulation measures to systematically study the relationship between bottleneck, X-factor, cycle time, and throughput measurements.

Original languageEnglish (US)
Title of host publicationASMC (Advanced Semiconductor Manufacturing Conference) Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages81-88
Number of pages8
Volume2003-January
ISBN (Print)0780376730
DOIs
StatePublished - 2003
Event14th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, ASMC 2003 - Munich, Germany
Duration: Mar 31 2003Apr 1 2003

Other

Other14th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, ASMC 2003
CountryGermany
CityMunich
Period3/31/034/1/03

Fingerprint

Dynamical systems
Throughput
Scheduling
Semiconductor materials

Keywords

  • Costs
  • Dynamic scheduling
  • Electronics industry
  • Information management
  • Job shop scheduling
  • Production
  • Productivity
  • Semiconductor device manufacture
  • Throughput
  • Time measurement

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Delp, D., Si, J., Hwang, Y., & Pei, K-W. (2003). A dynamic system regulation measure for increasing effective capacity: the X-factor theory. In ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings (Vol. 2003-January, pp. 81-88). [1194473] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ASMC.2003.1194473

A dynamic system regulation measure for increasing effective capacity : the X-factor theory. / Delp, D.; Si, Jennie; Hwang, Y.; Pei, Ker-Wei.

ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings. Vol. 2003-January Institute of Electrical and Electronics Engineers Inc., 2003. p. 81-88 1194473.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Delp, D, Si, J, Hwang, Y & Pei, K-W 2003, A dynamic system regulation measure for increasing effective capacity: the X-factor theory. in ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings. vol. 2003-January, 1194473, Institute of Electrical and Electronics Engineers Inc., pp. 81-88, 14th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, ASMC 2003, Munich, Germany, 3/31/03. https://doi.org/10.1109/ASMC.2003.1194473
Delp D, Si J, Hwang Y, Pei K-W. A dynamic system regulation measure for increasing effective capacity: the X-factor theory. In ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings. Vol. 2003-January. Institute of Electrical and Electronics Engineers Inc. 2003. p. 81-88. 1194473 https://doi.org/10.1109/ASMC.2003.1194473
Delp, D. ; Si, Jennie ; Hwang, Y. ; Pei, Ker-Wei. / A dynamic system regulation measure for increasing effective capacity : the X-factor theory. ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings. Vol. 2003-January Institute of Electrical and Electronics Engineers Inc., 2003. pp. 81-88
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