TY - GEN
T1 - A dynamic system regulation measure for increasing effective capacity
T2 - 14th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, ASMC 2003
AU - Delp, D.
AU - Si, Jennie
AU - Hwang, Y.
AU - Pei, Ker-Wei
N1 - Publisher Copyright:
© 2003 IEEE.
PY - 2003
Y1 - 2003
N2 - Due to the complex nature of semiconductor manufacturing it is evident that a single scheduling or regulation technique cannot best optimize the system dynamics for reducing cycle time and increasing throughput. The throughput of the system can increase to the effective capacity level of the system. When the throughput of the system approaches the effective capacity the product cycle time can dramatically increase. The "knee" of the performance curve indicates an operating point for fabs to maximize throughput while keeping the product cycle time relatively low. By increasing the effective capacity, i.e. adding a machine or improving a process, the product cycle time can be lowered or the system throughput increased by producing a shift in the "knee" of the performance curve. The bottleneck, typically defined as the most heavily utilized machine group, is often the target for increasing the system effective capacity. We will analyze the bottleneck along with other system capacity regulation measures to systematically study the relationship between bottleneck, X-factor, cycle time, and throughput measurements.
AB - Due to the complex nature of semiconductor manufacturing it is evident that a single scheduling or regulation technique cannot best optimize the system dynamics for reducing cycle time and increasing throughput. The throughput of the system can increase to the effective capacity level of the system. When the throughput of the system approaches the effective capacity the product cycle time can dramatically increase. The "knee" of the performance curve indicates an operating point for fabs to maximize throughput while keeping the product cycle time relatively low. By increasing the effective capacity, i.e. adding a machine or improving a process, the product cycle time can be lowered or the system throughput increased by producing a shift in the "knee" of the performance curve. The bottleneck, typically defined as the most heavily utilized machine group, is often the target for increasing the system effective capacity. We will analyze the bottleneck along with other system capacity regulation measures to systematically study the relationship between bottleneck, X-factor, cycle time, and throughput measurements.
KW - Costs
KW - Dynamic scheduling
KW - Electronics industry
KW - Information management
KW - Job shop scheduling
KW - Production
KW - Productivity
KW - Semiconductor device manufacture
KW - Throughput
KW - Time measurement
UR - http://www.scopus.com/inward/record.url?scp=84923069346&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84923069346&partnerID=8YFLogxK
U2 - 10.1109/ASMC.2003.1194473
DO - 10.1109/ASMC.2003.1194473
M3 - Conference contribution
AN - SCOPUS:84923069346
T3 - ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings
SP - 81
EP - 88
BT - 2003 IEEEI/SEMI Advanced Semiconductor Manufacturing Conference and Workshop
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 31 March 2003 through 1 April 2003
ER -