A drift-diffusion model of pinned photodiode enabling opto-electronic circuit simulation

Yanmei Su, Laidong Wang, Xinnan Lin, Jin He, Xiaojin Zhao, Yu Cao, Dongwei Zhang, Yongliang Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A drift-diffusion analytical model with bounded boundary conditions for CMOS image sensors (CIS) in a vertical pinned photodiode (PPD) is presented in this paper. According to the comparison with the numerical simulation and measured data, this model has been proved to be valid for fast simulation of optoelectronic integrated circuit (OEIC). Furthermore, it has been implemented into Hspice, to capture the specific characteristics of sensor applications with PPDs. This PPD model including concise mathematical formulation of carrier transport mechanism is useful in developing generic compact models which includes the advanced physical effects.

Original languageEnglish (US)
Title of host publicationTechnical Proceedings of the 2011 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2011
Pages682-685
Number of pages4
StatePublished - Nov 23 2011
Externally publishedYes
EventNanotechnology 2011: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2011 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2011 - Boston, MA, United States
Duration: Jun 13 2011Jun 16 2011

Publication series

NameTechnical Proceedings of the 2011 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2011
Volume2

Other

OtherNanotechnology 2011: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2011 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2011
CountryUnited States
CityBoston, MA
Period6/13/116/16/11

Keywords

  • CMOS image sensors
  • Drift-Diffussion model
  • Pinned photodiode

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'A drift-diffusion model of pinned photodiode enabling opto-electronic circuit simulation'. Together they form a unique fingerprint.

  • Cite this

    Su, Y., Wang, L., Lin, X., He, J., Zhao, X., Cao, Y., Zhang, D., & Li, Y. (2011). A drift-diffusion model of pinned photodiode enabling opto-electronic circuit simulation. In Technical Proceedings of the 2011 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2011 (pp. 682-685). (Technical Proceedings of the 2011 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2011; Vol. 2).