Fingerprint
Dive into the research topics of 'A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuits'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuits
Ivan S. Esqueda, Hugh Barnaby
Research output: Contribution to journal › Article › peer-review
19
Scopus
citations