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A DATA-DRIVEN APPROACH FOR AUTOMATED INTEGRATED CIRCUIT SEGMENTATION OF SCAN ELECTRON MICROSCOPY IMAGES
Zifan Yu, Bruno Machado Trindade, Michael Green, Zhikang Zhang, Pullela Sneha, Erfan Bank Tavakoli, Christopher Pawlowicz, Fengbo Ren
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
5
Scopus
citations