A comparison of theoretical and experimental L and M cross sections

J. Auerhammer, Peter Rez, F. Hofer

Research output: Contribution to journalArticle

15 Scopus citations

Abstract

Quantitative microanalysis using the EELS technique requires the knowledge of partial scattering cross sections to relate the measured edge intensities to the concentrations in the compounds. Experimental data are now available not only for L2, 3 edges, but also for M4, 5 edges, and can be used to test the quantification procedure by comparison of cross section ratios with calculations derived from a Hartree-Slater model. The deviations between theory and experiment range from about 5% in the case of S, Ca, La and Gd to about 50% for Cu, Zn and Ho to Yb.

Original languageEnglish (US)
Pages (from-to)365-370
Number of pages6
JournalUltramicroscopy
Volume30
Issue number3
DOIs
StatePublished - Jan 1 1989

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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