A comparative high-resolution study of interface chemistry in silicon-nitride-based ceramic matrix composites reinforced with silicon carbide whiskers

K. Das Chowdhury, Ray Carpenter, W. Braue

    Research output: Contribution to journalArticlepeer-review

    11 Scopus citations

    Abstract

    Silicon nitride/silicon carbide(w) ceramic matrix composites synthesized from common starting materials, except for the whiskers themselves, under the same processing conditions have been investigated. High-resolution electron microscopy and high-spatial-resolution electron energy loss nanospectroscopy were used to characterize the whisker/matrix interfaces in these composites both structurally and chemically. The presence of a discontinuous oxygen-rich amorphous layer at the two kinds of whisker/matrix interfaces examined in this paper appeared to be a general phenomenon. The wide difference (a factor of 10) between the structural image and chemical widths (oxygen distributions) of the whisker/matrix interfaces was attributed to oxygen solution into the silicon nitride matrix. The oxygen sources were the sintering aids and surface impurities.

    Original languageEnglish (US)
    Pages (from-to)229-239
    Number of pages11
    JournalUltramicroscopy
    Volume40
    Issue number3
    DOIs
    StatePublished - Mar 1992

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics
    • Instrumentation

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