A combined SERS and MCBJ study on molecular junctions on silicon chips

Jing Hua Tian, Bo Liu, Shan Jin, Ke Dai, Zhao Bin Chen, Xiulan Li, Huixian Ke, Sun Tao Wu, Yang Yang, Bin Ren, Bing Wei Mao, Nongjian Tao, Zhong Qun Tian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

We have developed a combined Surface-enhanced raman spectroscopy (SERS) and mechanically controllable break junction (MCBJ) method to detect and characterize molecular junctions formed by two electrochemically nanofabricated electrodes on silicon chips. The method allows us to obtain vibrational spectra of the molecular junction and perform electron transport measurement on the molecules simultaneously. The preliminary I/V characterization and SERS measurement on an asymmetric molecule, OPE-NO2, and a symmetric molecule, OPE, were conducted. This approach may provide new insights into not only electron transport in molecules, but also the enhancement mechanism in single-molecule SERS.

Original languageEnglish (US)
Title of host publication2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings
Pages1302-1305
Number of pages4
DOIs
StatePublished - 2007
Event2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007 - Hong Kong, China
Duration: Aug 2 2007Aug 5 2007

Other

Other2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007
CountryChina
CityHong Kong
Period8/2/078/5/07

Fingerprint

Raman spectroscopy
chips
Silicon
Molecules
silicon
molecules
Vibrational spectra
vibrational spectra
electrons
Electrodes
electrodes
augmentation
Electron Transport

Keywords

  • Conductance
  • MCBJ
  • Molecular junctions
  • SERS
  • Single-molecule

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

Cite this

Tian, J. H., Liu, B., Jin, S., Dai, K., Chen, Z. B., Li, X., ... Tian, Z. Q. (2007). A combined SERS and MCBJ study on molecular junctions on silicon chips. In 2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings (pp. 1302-1305). [4601421] https://doi.org/10.1109/NANO.2007.4601421

A combined SERS and MCBJ study on molecular junctions on silicon chips. / Tian, Jing Hua; Liu, Bo; Jin, Shan; Dai, Ke; Chen, Zhao Bin; Li, Xiulan; Ke, Huixian; Wu, Sun Tao; Yang, Yang; Ren, Bin; Mao, Bing Wei; Tao, Nongjian; Tian, Zhong Qun.

2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings. 2007. p. 1302-1305 4601421.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tian, JH, Liu, B, Jin, S, Dai, K, Chen, ZB, Li, X, Ke, H, Wu, ST, Yang, Y, Ren, B, Mao, BW, Tao, N & Tian, ZQ 2007, A combined SERS and MCBJ study on molecular junctions on silicon chips. in 2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings., 4601421, pp. 1302-1305, 2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Hong Kong, China, 8/2/07. https://doi.org/10.1109/NANO.2007.4601421
Tian JH, Liu B, Jin S, Dai K, Chen ZB, Li X et al. A combined SERS and MCBJ study on molecular junctions on silicon chips. In 2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings. 2007. p. 1302-1305. 4601421 https://doi.org/10.1109/NANO.2007.4601421
Tian, Jing Hua ; Liu, Bo ; Jin, Shan ; Dai, Ke ; Chen, Zhao Bin ; Li, Xiulan ; Ke, Huixian ; Wu, Sun Tao ; Yang, Yang ; Ren, Bin ; Mao, Bing Wei ; Tao, Nongjian ; Tian, Zhong Qun. / A combined SERS and MCBJ study on molecular junctions on silicon chips. 2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings. 2007. pp. 1302-1305
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