A built-in self-test technique for transmitter-only systems

Maryam Shafiee, Jennifer Kitchen, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Internet of Things (IoT) nodes used in environmental monitoring and smart city applications are becoming increasingly prevalent with over $200B projected market potential. These nodes typically employ one-way communications using a high-end transmitter without a corresponding receiver. Testing of such transmitter-only systems poses an additional challenge. Due to the lack of a receiver, low-cost test techniques, such as loop-back, cannot be used. In this paper, we present a low overhead built-in self-test (BIST) technique to characterize imbalances of IQ transmitters without a receiver, both for post-production and in-field test purposes. The proposed BIST uses simple circuitry and a single test setup. The target parameters are analytically computed independent from internal BIST parameters which eliminates the need for initial calibration phase. All measurements are in DC and no external RF signal generation is required. The overall measurement time, including the computation time, is less than 2ms. Simulation and measurement results show that the proposed method provides adequate estimation accuracy for digital calibration.

Original languageEnglish (US)
Title of host publicationProceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018
PublisherIEEE Computer Society
Pages1-6
Number of pages6
Volume2018-April
ISBN (Electronic)9781538637746
DOIs
StatePublished - May 29 2018
Event36th IEEE VLSI Test Symposium, VTS 2018 - San Francisco, United States
Duration: Apr 22 2018Apr 25 2018

Other

Other36th IEEE VLSI Test Symposium, VTS 2018
CountryUnited States
CitySan Francisco
Period4/22/184/25/18

Fingerprint

Built-in self test
Transmitters
Calibration
Time measurement
Monitoring
Communication
Testing
Costs

Keywords

  • Built-in self-test (BIST)
  • IQ Transmitter
  • RF test

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Shafiee, M., Kitchen, J., & Ozev, S. (2018). A built-in self-test technique for transmitter-only systems. In Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018 (Vol. 2018-April, pp. 1-6). IEEE Computer Society. https://doi.org/10.1109/VTS.2018.8368636

A built-in self-test technique for transmitter-only systems. / Shafiee, Maryam; Kitchen, Jennifer; Ozev, Sule.

Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018. Vol. 2018-April IEEE Computer Society, 2018. p. 1-6.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Shafiee, M, Kitchen, J & Ozev, S 2018, A built-in self-test technique for transmitter-only systems. in Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018. vol. 2018-April, IEEE Computer Society, pp. 1-6, 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, United States, 4/22/18. https://doi.org/10.1109/VTS.2018.8368636
Shafiee M, Kitchen J, Ozev S. A built-in self-test technique for transmitter-only systems. In Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018. Vol. 2018-April. IEEE Computer Society. 2018. p. 1-6 https://doi.org/10.1109/VTS.2018.8368636
Shafiee, Maryam ; Kitchen, Jennifer ; Ozev, Sule. / A built-in self-test technique for transmitter-only systems. Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018. Vol. 2018-April IEEE Computer Society, 2018. pp. 1-6
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