A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters

Tao Liu, Chao Fu, Sule Ozev, Bertan Bakkaloglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

One of the major problems associated with integrated DC-DC converters used in state of the art Power Management ICs (PMICs) is dynamic performance and stability degradation due to off-chip component and output current variations. A high accuracy built-in self-test (BIST) architecture measuring load inductance and DC resistance (DCR) of DC-DC converters is presented. The DCR measurement of the inductor also enables continuous, lossless average load current sensing of the DC-DC converter across the inductor. Both the BIST circuit and the primary signal chain utilize low analog complexity frequency-domain ΔΣADC. The ΔΣADC decimation filter nulls also provide current ripple cancellation and average current extraction. The BIST module can measure filter inductance values ranging from 3.6μH to 22.3μH range with average 2.0% error and inductor DCR 13mΩ to 68mΩ range with average 2.1% error. The average current sensing enabled by the BIST technique achieves current measurement accuracy with average 2.3% error for 0.1A-1A range load current. BIST and current sensing modules occupy less than 6% of total chip area. The BIST circuitry is fabricated and tested with a 12V input, 1V-11.5V output range, for a 3W output power digital DC-DC converter.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE VLSI Test Symposium
PublisherIEEE Computer Society
ISBN (Print)9781479926114
DOIs
StatePublished - 2014
Event2014 IEEE 32nd VLSI Test Symposium, VTS 2014 - Napa, CA, United States
Duration: Apr 13 2014Apr 17 2014

Other

Other2014 IEEE 32nd VLSI Test Symposium, VTS 2014
CountryUnited States
CityNapa, CA
Period4/13/144/17/14

Fingerprint

Built-in self test
DC-DC converters
Inductance
Electric current measurement
Degradation
Networks (circuits)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Science Applications

Cite this

A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters. / Liu, Tao; Fu, Chao; Ozev, Sule; Bakkaloglu, Bertan.

Proceedings of the IEEE VLSI Test Symposium. IEEE Computer Society, 2014. 6818750.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Liu, T, Fu, C, Ozev, S & Bakkaloglu, B 2014, A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters. in Proceedings of the IEEE VLSI Test Symposium., 6818750, IEEE Computer Society, 2014 IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, United States, 4/13/14. https://doi.org/10.1109/VTS.2014.6818750
Liu, Tao ; Fu, Chao ; Ozev, Sule ; Bakkaloglu, Bertan. / A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters. Proceedings of the IEEE VLSI Test Symposium. IEEE Computer Society, 2014.
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