A 90 nm bulk CMOS radiation hardened by design cache memory

Xiaoyin Yao, Lawrence T. Clark, Dan W. Patterson, Keith Holbert

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Fingerprint

Dive into the research topics of 'A 90 nm bulk CMOS radiation hardened by design cache memory'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy