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  • Rong Pan
2012

Statistical analysis of 10+ years field exposed c-Si modules performance degradation

Kuitche, J. M., Tamizhmani, G. & Pan, R., Dec 1 2012, Reliability of Photovoltaic Cells, Modules, Components, and Systems V. 84720C. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 8472).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Statistical analysis of back surface vs. cell temperatures of c-Si modules using measurement error models

Kuitche, J. M., Pan, R. & Tamizhmani, G., Nov 26 2012, Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012. p. 2953-2956 4 p. 6318204. (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Statistical analysis of commercial c-Si PV module photovoltaic efficiency distribution over 10-years period

Kuitche, J. M., Sharma, V., Oh, J., Pan, R. & Tamizhmani, G., Nov 26 2012, Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012. p. 2421-2425 5 p. 6318085. (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations
2011

A generalized linear model approach to designing accelerated life test experiments

Monroe, E. M., Pan, R., Anderson-Cook, C. M., Montgomery, D. & Borror, C. M., Jun 1 2011, In : Quality and Reliability Engineering International. 27, 4, p. 595-607 13 p.

Research output: Contribution to journalArticle

26 Scopus citations

A GLM approach to optimal ALT test plans for weibull distribution with type-i censoring

Pan, R. & Yang, T., 2011, SAE Technical Papers.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A GLM approach to optimal ALT test plans for weibull distribution with type-i censoring

Pan, R. & Yang, T., Jan 1 2011, In : SAE Technical Papers.

Research output: Contribution to journalConference article

1 Scopus citations

A GLM approach to optimal ALT test plans for weibull distribution with type-I censoring

Pan, R. & Yang, T., 2011, SAE 2011 World Congress and Exhibition.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

A hierarchical modeling approach to accelerated degradation testing data analysis: A case study

Pan, R. & Crispin, T., Mar 1 2011, In : Quality and Reliability Engineering International. 27, 2, p. 229-237 9 p.

Research output: Contribution to journalArticle

32 Scopus citations

An enhanced parenting process: Predicting reliability in product's design phase

Sanchez, L. M. & Pan, R., Oct 1 2011, In : Quality Engineering. 23, 4, p. 378-387 10 p.

Research output: Contribution to journalArticle

11 Scopus citations

Degradation analysis of solar photovoltaic modules: Influence of environmental factor

Pan, R., Kuitche, J. & Tamizhmani, G., May 27 2011, 2011 Proceedings - Annual Reliability and Maintainability Symposium, RAMS 2011. 5754514. (Proceedings - Annual Reliability and Maintainability Symposium).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

18 Scopus citations

Demand-supply interaction and inventory buildup strategies for short life cycle products

Pan, R., Solis, A. O. & Paul, B., 2011, 10th International Conference on Modeling and Applied Simulation, MAS 2011, Held at the International Mediterranean and Latin American Modeling Multiconference, I3M 2011. Caltek s.r.l., p. 314-321 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Digital additive manufacturing for engineering education: A virtual Rapid Prototyping simulator approach

Bill Tseng, T. L., Pan, R., Zheng, J., Gonzalez, M. V., Awalt, C. J. & Medina, F., Jan 1 2011, In : ASEE Annual Conference and Exposition, Conference Proceedings.

Research output: Contribution to journalArticle

2 Scopus citations

Failure modes effects and criticality analysis (FMECA) approach to the crystalline silicon photovoltaic module reliability assessment

Kuitche, J. M., Tamizhmani, G. & Pan, R., Nov 29 2011, Reliability of Photovoltaic Cells, Modules, Components, and Systems IV. 81120L. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 8112).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Rebellion on sugarscape: Case studies for greed and grievance theory of civil conflicts using agent-bBased models

Pan, R., Mar 14 2011, Social Computing, Behavioral-Cultural Modeling and Prediction - 4th International Conference, SBP 2011, Proceedings. p. 333-340 8 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 6589 LNCS).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Robustness and reliability consideration in product design optimization under uncertainty

Zhuang, X., Pan, R. & Wang, L., Dec 1 2011, IEEE International Conference on Industrial Engineering and Engineering Management, IEEM2011. p. 1325-1329 5 p. 6118131. (IEEE International Conference on Industrial Engineering and Engineering Management).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations