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  • Terry Alford

Ag-chalcogenide glass flexible radiation sensor: Impact of atomic ratio of Se on the TID influenced lateral diffusion of Ag

Mahmud, A., Gonzalez Velo, Y., Taggart, J., Bamaby, H. J., Kozicki, M., Holbert, K., Mitkova, M., Alford, T., Goryll, M. & Chen, W., Oct 31 2017, 2016 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016. Institute of Electrical and Electronics Engineers Inc., Vol. 2016-September. p. 1-3 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A fast technique to screen carrier generation lifetime using DLTS on MOS capacitors

Elhami Khorasani, A., Schroder, D. K. & Alford, T., Sep 2014, In : IEEE Transactions on Electron Devices. 61, 9, p. 3282-3288 7 p., 6867334.

Research output: Contribution to journalArticle

4 Scopus citations

A fast I-V screening measurement for tddb assessment of ultra-thick inter-metal dielectrics

Khorasani, A. E., Griswold, M. & Alford, T., Jan 1 2014, In : IEEE Electron Device Letters. 35, 1, p. 117-119 3 p., 6680596.

Research output: Contribution to journalArticle

3 Scopus citations

Advances in 2D/3D printing of functional nanomaterials and their applications

Choi, J. Y., Das, S., Theodore, N. D., Kim, I., Honsberg, C., Choi, H. W. & Alford, T., Jan 1 2015, In : ECS Journal of Solid State Science and Technology. 4, 4, p. P3001-P3009

Research output: Contribution to journalArticle

19 Scopus citations