50-Ω-matched system for low-temperature measurements of the time-resolved conductance of low-dimensional semiconductors

B. Naser, J. Heeren, D. K. Ferry, J. P. Bird

Research output: Contribution to journalReview article

8 Scopus citations

Abstract

We describe the construction of a low-temperature cryostat that may be used to study the time-dependent conductivity of low-dimensional semiconductors with time resolution of a few-hundred picoseconds. The system makes use of semirigid coaxial cables to provide the necessary connections from room-temperature instrumentation to the low-temperature stage, and features a specially designed launch that provides efficient 50 Ω impedance matching to the semiconductor system of interest. In order to explore the capabilities of the system, we perform time-resolved measurements of the magnetotransport properties of a high mobility GaAsAlGaAs two-dimensional electron gas.

Original languageEnglish (US)
Article number113905
Pages (from-to)1-5
Number of pages5
JournalReview of Scientific Instruments
Volume76
Issue number11
DOIs
StatePublished - Dec 12 2005

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ASJC Scopus subject areas

  • Instrumentation

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