3D Simulation of Deep-Submicron Devices: How Impurity Atoms Affect Conductance

Fing Rong Zhou, David K. Ferry

Research output: Contribution to journalArticlepeer-review

31 Scopus citations
Original languageEnglish (US)
Pages (from-to)30-37
Number of pages8
JournalIEEE Computational Science and Engineering
Volume2
Issue number2
DOIs
StatePublished - 1995

ASJC Scopus subject areas

  • Engineering(all)

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