2D automated visual inspection system for the remote quality control of SMD assembly

Alejandro Gallegos-Hernández, Francisco J. Ruiz-Sánchez, Jesus Villalobos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

In this paper, we present a general description of a new Automated Visual Inspection system designed with a mechatronic approach, to address the problem of quality control in a SMT assembly process line. The system provides hardware and software facilities to be used as a test bench for new algorithms related to inspection and decision making, and it allows for remote access. We include a description of our first application to detect presence/absence or misplace of Surface Mounted Devices using 2D analysis and 3D reconstruction. Also, we describe the remote access package developed with Jini™ technologies to integrate our system to the Jini™ Virtual Manufacturing Lab. This AVI system was created as a part of the Mexico-USA project in manufacturing research, MANET.

Original languageEnglish (US)
Title of host publicationIECON Proceedings (Industrial Electronics Conference)
Pages2219-2224
Number of pages6
Volume3
StatePublished - 2002
EventProceedings of the 2002 28th Annual Conference of the IEEE Industrial Electronics Society - Sevilla, Spain
Duration: Nov 5 2002Nov 8 2002

Other

OtherProceedings of the 2002 28th Annual Conference of the IEEE Industrial Electronics Society
CountrySpain
CitySevilla
Period11/5/0211/8/02

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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