Abstract
In this paper, we present a general description of a new Automated Visual Inspection system designed with a mechatronic approach, to address the problem of quality control in a SMT assembly process line. The system provides hardware and software facilities to be used as a test bench for new algorithms related to inspection and decision making, and it allows for remote access. We include a description of our first application to detect presence/absence or misplace of Surface Mounted Devices using 2D analysis and 3D reconstruction. Also, we describe the remote access package developed with Jini™ technologies to integrate our system to the Jini™ Virtual Manufacturing Lab. This AVI system was created as a part of the Mexico-USA project in manufacturing research, MANET.
| Original language | English (US) |
|---|---|
| Title of host publication | IECON Proceedings (Industrial Electronics Conference) |
| Pages | 2219-2224 |
| Number of pages | 6 |
| Volume | 3 |
| State | Published - 2002 |
| Event | Proceedings of the 2002 28th Annual Conference of the IEEE Industrial Electronics Society - Sevilla, Spain Duration: Nov 5 2002 → Nov 8 2002 |
Other
| Other | Proceedings of the 2002 28th Annual Conference of the IEEE Industrial Electronics Society |
|---|---|
| Country/Territory | Spain |
| City | Sevilla |
| Period | 11/5/02 → 11/8/02 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering