Transient Radiation Effects Modeling on SM-3 UKW IDA Card Transient Radiation Effects Modeling on SM-3 UKW IDA Card The primary goal of this study is to initiate the development of a tools interface between the Raytheon and ASU radiation effects modeling programs. This development effort will use the SM-3 UKWs IDA card, a critical sensing application, as its TRE modeling demonstration vehicle. Arizona State University (PI Hugh Barnaby) will perform transient radiation effects (TRE) analysis on on the IDA card. The IDA card is an analog sensing and data converter board that has been identified as potentially susceptible to errors caused by transient radiation exposure. Charge, generated in semiconductor materials by the absorption of energy from high energy particles and photons, can be collected at critical circuit nodes, leading to deleterious single event transients, upsets, and hard errors in the application components (e.g., soft errors, latchup). In this study, ASU will build a radiation-aware model of the system components based on inputs provided by Raytheon. These inputs will include energy deposition profiles obtained via simulation with the TopAct simulation tool. The ASU team will utilize the TopAct results to build models for estimating chip-level electrical responses. As an option in this study phase, ASU will build radiation-enabled macro-models for board subsystems (e.g., sensor, converter) to be used in subsequent phases of the modeling effort.
|Effective start/end date||8/31/09 → 12/12/09|
- INDUSTRY: Domestic Company: $40,000.00
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