The transmission electron microscope (TEM) has been widely used to investigate multilayered oxide heterostructures. Complementary imaging, diffraction and microanalysis provide crucial information about microstructure, crystallography and composition. The use of transmission and high-resolution TEM for defect identification and strain field analysis, Zcontrast imaging in scanning TEM for cation distribution, convergent-beam electron diffraction (CBED) for local lattice parameter, and electron holography for internal electromagnetic fields, allow the often competing effects of growth conditions and compositional differences to be determined. In this collaborative project, these various TEM techniques will be combined with aberration-corrected imaging and microanalysis to thoroughly characterize epitaxial oxide/oxide heterostructures. Close cooperation with the sample growers at UT Austin will provide the rapid feedback that is essential for optimization of deposition conditions and growth of optimal materials. Mapping electrostatic fields and sheet charge across oxide/oxide interfaces Electron holography is a TEM interference technique that enables the phase distribution of the electron wave that has passed through a sample to be visualized with nanometer-scale spatial resolution. This technique will be used to quantify the internal electrostatic fields and sheet charge present at the oxide/oxide interfaces that will be grown at UT Austin as part of this research program.
|Effective start/end date||9/30/12 → 9/29/17|
- DOD-USAF-AFRL: Air Force Office of Scientific Research (AFOSR): $388,893.00
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