Thermodynamic Stability of the Q-2DEG at the OxideOxide Interface under Extreme Thermomechanical Conditions

Project: Research project

Description

The transmission electron microscope (TEM) has been widely used to investigate multilayered oxide heterostructures. Complementary imaging, diffraction and microanalysis provide crucial information about microstructure, crystallography and composition. The use of transmission and high-resolution TEM for defect identification and strain field analysis, Zcontrast imaging in scanning TEM for cation distribution, convergent-beam electron diffraction (CBED) for local lattice parameter, and electron holography for internal electromagnetic fields, allow the often competing effects of growth conditions and compositional differences to be determined. In this collaborative project, these various TEM techniques will be combined with aberration-corrected imaging and microanalysis to thoroughly characterize epitaxial oxide/oxide heterostructures. Close cooperation with the sample growers at UT Austin will provide the rapid feedback that is essential for optimization of deposition conditions and growth of optimal materials. Mapping electrostatic fields and sheet charge across oxide/oxide interfaces Electron holography is a TEM interference technique that enables the phase distribution of the electron wave that has passed through a sample to be visualized with nanometer-scale spatial resolution. This technique will be used to quantify the internal electrostatic fields and sheet charge present at the oxide/oxide interfaces that will be grown at UT Austin as part of this research program.
StatusFinished
Effective start/end date9/30/129/29/17

Funding

  • DOD-USAF-AFRL: Air Force Office of Scientific Research (AFOSR): $388,893.00

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thermodynamics
oxides
electron microscopes
microanalysis
holography
electrons
electric fields
crystallography
aberration
lattice parameters
electromagnetic fields
electron diffraction
spatial resolution
interference
cations
microstructure
optimization
scanning
high resolution
defects