The Effect of Silicon Quality on LDMOS Device Reverse Recovery (ASUF 30005875)

Project: Research project

StatusFinished
Effective start/end date1/1/1412/31/17

Funding

  • INDUSTRY: Domestic Company: $60,000.00

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recovery
defects
silicon
diodes
carrier lifetime
semiconductor devices
students
transmission lines
capacitors
spatial distribution
trapping
methodology
impurities
pulses