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Integrity and Reliability of Integrated Circuits (IRIS) Phase III
Cao, Yu
(PI)
IAFSE-ECEE: Electrical Engineering
Project
:
Research project
Overview
Project Details
Status
Finished
Effective start/end date
4/1/16
→
5/31/18
Funding
DOD-DARPA: Microsystems Technology Office (MTO):
$264,184.00
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