Identification of Radiation Response Mechanisms in Hall Effect Sensor

Project: Research project

Project Details

Description

Identification of Radiation Response Mechanisms in Hall Effect Sensor Identification of Radiation Response Mechanisms in Hall Effect Sensor Medtronicss L386 Hall effect sensor has exhibited total ionizing dose degradation in key operation specifications. Medtronic wishes to understand the problem in enough detail to achieve suitable radiation hardness levels by applying mitigation strategies to the fabrication processes, devices, and/or circuit designs. In this program Arizona State University will investigate and identify the potential causes for the radiation sensitivity of the L386. The program will be principally focused on the identification of circuit-level radiation response mechanisms. Sensitive sub-circuits identified through a careful examination of the L386 radiation response will be analyzed to identify degradation mechanisms. The techniques employed for this task will combine circuit-level analysis [1], methodologies that correlate circuit and transistor responses [2], and a detailed review of IC layout. The goal of this task will be to discover the primary causes of enhanced radiation sensitivity in the L386 and to provide recommendations for part hardening. These recommendations may include new rules for IC layout, the implementation of radiationhardening- by-design practices, and/or suggestions for IC re-design. Identification of Radiation Response Mechanisms in Medtronic Devices Identification of Radiation Response Mechanisms in Medtronic Devices
StatusFinished
Effective start/end date9/22/089/20/10

Funding

  • INDUSTRY: Domestic Company: $134,015.00

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