Defect Characterization in SiC Buffer Layers

Project: Research project

Project Details

Description

Defect Characterization in SiC Buffer Layers Defect Characterization in SiC Buffer Layers
StatusFinished
Effective start/end date1/15/043/15/05

Funding

  • DOD-ARMY-ARL: Army Research Office (ARO): $62,500.00

Fingerprint

Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.