Defect Based Analog Circuit Diagnosis and Yield Enhancement (ASUF 30005817) Defect Based Analog Circuit Diagnosis and Yield Enhancement Dr. Ozev will be working on developing fault modeling, simulation, analysis and yield improvement techniques for analog/RF circuits. This project will entail inductive fault analysis, a novel way of ranking faults with respect to their probability, simulating faults with process variations, and determining fault locations from measured data.
|Effective start/end date||5/1/13 → 4/30/23|
- INDUSTRY: Domestic Company: $25,000.00
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